The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Aug. 05, 2010
Meng-day Yu, Fremont, CA (US);
Meng-Day Yu, Fremont, CA (US);
Verayo, Inc., San Jose, CA (US);
Abstract
Values generated by at least one pseudo-random source (PRS) are recombined to form one or more recombined values. The method involves using analog, digital, or hybrid manipulation techniques to transform characteristics of PRS, including but not limited to statistical characteristics, and input/output characteristics. In some examples, the recombination method provides a way to de-bias output bits from PRS without appreciable increase in self noise. In some examples, the recombined result passes NIST's Statistical Tests for Randomness even if underlying PRS natively does not. In some examples, the recombination method provides a way to make a PRS challengeable, even if the underlying PRS is not natively challengeable. In some examples, recombination is used to allow single PRS to have multiple outputs, and in some cases multi-dimensional (orthogonal) outputs. In some examples, a multi-modal system is created via recombination using multiple PRS. In some examples, post recombined result exhibit super error characteristics (prior to application of any error correction codes) compared to native PRS output. In some examples, the recombined values are applied to security applications, for instance authentication and/or cryptographic functions, which may provide improved characteristics (e.g., cryptographic strength) in view of a de-biased output which in some examples also passes NIST's Statistical Tests.