The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Sep. 21, 2010
Jason G. Mchugh, Seattle, WA (US);
Eric Yves Theriault, Seattle, WA (US);
Seth W. Markle, Seattle, WA (US);
Jason G. McHugh, Seattle, WA (US);
Eric Yves Theriault, Seattle, WA (US);
Seth W. Markle, Seattle, WA (US);
Amazon Technology, Inc., Reno, NV (US);
Abstract
Embodiments may include a consistency measurement component that utilizes memory-efficient sets (e.g., Bloom filters) assigned to different time periods for tracking when different write operations are performed on replicated data objects within a distributed data store. The consistency measurement component may evaluate whether read operations directed to the distributed data store are inconsistent. To do so, the consistency measurement component may determine, for a given read operation, the age of the value read from a given replicated data object (e.g., by evaluating a 'last-modified' timestamp). The consistency measurement component may identify a memory-efficient set that includes the key of that replicated data object in order to determine when the replicated data object was last written to. If the age of the value read is older than the time at which the replicated data object was last written to, the consistency measurement component may determine that the read operation was inconsistent.