The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Aug. 18, 2010
Hung-yang Chang, Watson, NY (US);
Joachim H. Frank, Somers, NY (US);
Christoph Lingenfelder, Yorktown Heights, NY (US);
Liangzhao Zeng, Mohegan Lake, NY (US);
Hung-yang Chang, Watson, NY (US);
Joachim H. Frank, Somers, NY (US);
Christoph Lingenfelder, Yorktown Heights, NY (US);
Liangzhao Zeng, Mohegan Lake, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system, and computer usable program product for non-intrusive event-driven prediction of a metric in a data processing environment are provided in the illustrative embodiments. At least one set of events is observed in the data processing environment, the set of events being generated by several processes executing in the data processing environment. A subset of the set of events are tracked for an observation period, the tracking resulting in bookkeeping information about the subset of events. A pattern of events is detected in the bookkeeping information. The pattern is formed as a tuple representing a process in the several processes, the metric corresponding to the process. A prediction model is selected for the tuple. The prediction model is supplied with the tuple and executed to generate a predicted value of the metric.