The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Mar. 29, 2008
Hisayuki Sueoka, Tokyo, JP;
Hiroshi Yoshida, Tokyo, JP;
Tatsumi Otomura, Tokyo, JP;
Hiroya Mitsushima, Tokyo, JP;
Hisayuki Sueoka, Tokyo, JP;
Hiroshi Yoshida, Tokyo, JP;
Tatsumi Otomura, Tokyo, JP;
Hiroya Mitsushima, Tokyo, JP;
Hirata Corporation, Tokyo, JP;
Abstract
The present invention provides a method for measuring a clearance () between facing surfaces of a first member () and a second member (). The method includes a step (S) of bringing a pair of probes each having a tip end () slightly larger than the clearance () into direct contact with the clearance () and measuring a separation distance between the two tip ends (), and a calculating step (S) of calculating and measuring a clearance value (d) on the basis of the separation distance between the tip ends ().