The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Aug. 31, 2010
Michael David Huffman, Tacoma, WA (US);
Andrew James Booker, Seattle, WA (US);
Thomas A. Hogan, Seattle, WA (US);
Alan K. Jones, Seattle, WA (US);
Bruce C. Andrews, Mukilteo, WA (US);
Michael David Huffman, Tacoma, WA (US);
Andrew James Booker, Seattle, WA (US);
Thomas A. Hogan, Seattle, WA (US);
Alan K. Jones, Seattle, WA (US);
Bruce C. Andrews, Mukilteo, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for inspecting a surface of an object. Data from measuring the surface of the object is obtained to form surface data for the object. A range of frequencies for features on the object is selected based on a range of distances between adjacent peaks for the features. The features are formed by a tool moving along a number of paths. Desired surface data for the features is obtained from the surface data using the range of frequencies selected. A determination is made as to whether the desired surface data for the features meets a policy specifying a desired surface for the object. In response to an absence of a determination that the desired surface data for the features meets the policy, the object is reworked.