The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Jul. 01, 2010
Ernest T. Ozaki, San Diego, CA (US);
Kenny Fok, San Diego, CA (US);
Paul M. Seckendorf, San Diego, CA (US);
Tia Manning Cassett, San Diego, CA (US);
Patrick Tierney, San Diego, CA (US);
Gregory Alan Breit, San Diego, CA (US);
Jing LI, San Diego, CA (US);
Ernest T. Ozaki, San Diego, CA (US);
Kenny Fok, San Diego, CA (US);
Paul M. Seckendorf, San Diego, CA (US);
Tia Manning Cassett, San Diego, CA (US);
Patrick Tierney, San Diego, CA (US);
Gregory Alan Breit, San Diego, CA (US);
Jing Li, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems, methods, apparatus, processors and computer-readable media include a radiated testing module that executes a predetermined radiated performance test on a wireless device. The test dictates various performance-related parameters to measure and log at each of a plurality of predetermined positions. Further, the wireless device receives synchronization information operable to enable synchronization between the logged measurements and each of the positions. The synchronized log allows the wireless device, or another apparatus, to determine a radiated performance characteristic based on a predetermined analysis protocol. Further, the described embodiments allow for the determination of several radiated performance characteristics in a single test, using a single, unaltered wireless device.