The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Nov. 30, 2009
Applicants:

William Dean Warner, Maple Ridge, CA;

Graeme B. Boyd, North Vancouver, CA;

William Michael Lye, Coquitlam, CA;

Inventors:

William Dean Warner, Maple Ridge, CA;

Graeme B. Boyd, North Vancouver, CA;

William Michael Lye, Coquitlam, CA;

Assignee:

PMC-Sierra US, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method to look at the incoming received data on a SerDes link while running in normal operation without requiring a second receive path or any defined or repeated data patterns to be able to generate statistical eye plots both before and after any internal equalization; generate trajectory eye plots both before and after any internal equalization; estimate TED characteristics (hence also estimate SJ jitter tolerance of the link); estimate complete Channel Impulse Response (hence also estimate the S-parameters of the complete channel); and estimate the decomposed jitter of the complete channel.


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