The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Jul. 24, 2008
Applicants:

Shinji Sano, Kawasaki, JP;

Manabu Takcbayashi, Isehara, JP;

Inventors:

Shinji Sano, Kawasaki, JP;

Manabu Takcbayashi, Isehara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G03G 15/01 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scan line profile characteristic representing the distortion of a scan line is detected. Dot image data undergoes the screen process using a dither matrix. At this time, the quantization process is done by shifting a dither matrix element in the sub-scanning direction opposite to the direction of the scan line changing process at a scan line changing point in the scan line changing process in accordance with the profile characteristic. The image data after the screen process undergoes the scan line changing process, and the interpolation process smooths the scan line changing point.


Find Patent Forward Citations

Loading…