The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Jun. 12, 2012
Applicants:
Ole Eichhorn, Westlake Village, CA (US);
Allen Olson, San Diego, CA (US);
Inventors:
Ole Eichhorn, Westlake Village, CA (US);
Allen Olson, San Diego, CA (US);
Assignee:
Aperio Technologies, Inc., Vista, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G06F 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for processing and analyzing virtual microscopy digital images. In an embodiment, identifications of one or more algorithms and one or more digital slide images are received over a network. In addition, one or more parameter data are received that constrain the execution of the algorithm(s) to defined sub-region(s) of the digital slide image(s). The digital slide image(s) are retrieved, and the identified algorithm(s) are executed to analyze the defined sub-region(s) of the digital slide image(s).