The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Jul. 01, 2010
Applicants:
Katsuhiro Ishii, Hamamatsu, JP;
Sohichiro Nakamura, Minami-ashigara, JP;
Yuki Sato, Minami-ashigara, JP;
Inventors:
Katsuhiro Ishii, Hamamatsu, JP;
Sohichiro Nakamura, Minami-ashigara, JP;
Yuki Sato, Minami-ashigara, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring process.