The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Oct. 15, 2009
Applicants:

Shingo Imanishi, Kanagawa, JP;

Takeo Arai, Saitama, JP;

Suguro Dowaki, Kanagawa, JP;

Inventors:

Shingo Imanishi, Kanagawa, JP;

Takeo Arai, Saitama, JP;

Suguro Dowaki, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measuring device includes: a light applying section configured to apply laser light to a sample flowing in a channel; and a fluorescence detecting section configured to detect fluorescence generated from the sample irradiated with the laser light; the fluorescence detecting section including a multichannel photomultiplier tube having a plurality of detection channels capable of simultaneously detecting a plurality of light beams, a light separator configured to separate the fluorescence according to wavelengths to provide the plurality of light beams, the light separator being provided by a transmission grating or a prism, and a telecentric condenser lens configured to receive the plurality of light beams from the light separator and direct the plurality of light beams toward the plurality of detection channels of the multichannel photomultiplier tube so that the optical axes of the plurality of light beams are parallel to each other.


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