The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Nov. 06, 2009
Kuanglin Chao, Ellicott City, MD (US);
Moon S. Kim, Silver Spring, MD (US);
Alan M. Lefcourt, Elkridge, MD (US);
David Tuschel, Monroeville, PA (US);
Oksana Olkhovyk, Pittsburgh, PA (US);
Yongliang Liu, Laurel, MD (US);
Kuanglin Chao, Ellicott City, MD (US);
Moon S. Kim, Silver Spring, MD (US);
Alan M. Lefcourt, Elkridge, MD (US);
David Tuschel, Monroeville, PA (US);
Oksana Olkhovyk, Pittsburgh, PA (US);
Yongliang Liu, Laurel, MD (US);
The United States of America as represented by the Secretary of Agriculture, Washington, DC (US);
Abstract
System and method for determining the presence of a contaminant in a sample using Raman spectroscopic data. The sample may be food or feed and the contaminant may be melamine. The sample is illuminated with substantially monochromatic light to produce Raman scattered photons. The Raman scattered photons are collected to generate Raman spectroscopic data. The Raman spectroscopic data may comprise at least one of a Raman spectrum and a spatially accurate wavelength resolved Raman image. The Raman spectroscopic data is analyzed to determine the presence or absence of a contaminant in a sample. The concentration of the contaminant in the sample can also be determined by using a ratio algorithm.