The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
May. 14, 2009
Toshiyuki Suzuma, Osaka, JP;
Kenji Imanishi, Osaka, JP;
Toshiyuki Suzuma, Osaka, JP;
Kenji Imanishi, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
A magnetic testing apparatus has a magnetizing device applying a rotating magnetic field to a material to be tested, a testing signal detecting device, and a signal processing device applying signal processing to the testing signal. The signal processing device has a first synchronous detecting device detecting a testing signal by using the first current as a reference signal, a second synchronous detecting device detecting an output signal of the first synchronous detecting device by using the second current as a reference signal to extract a candidate flaw signal, and a testing image display device displaying a testing image in which each of pixels has a gray level corresponding to an intensity of the candidate flaw signal at each of positions of the material to be tested, and a phase of the candidate flaw signal at each of the positions is capable of being identified.