The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Aug. 02, 2010
Takeo Tanaami, Musashino, JP;
Hidetoshi Aoki, Musashino, JP;
Yumiko Sugiyama, Musashino, JP;
Souichirou Shimoda, Musashino, JP;
Muneki Araragi, Musashino, JP;
Takeo Tanaami, Musashino, JP;
Hidetoshi Aoki, Musashino, JP;
Yumiko Sugiyama, Musashino, JP;
Souichirou Shimoda, Musashino, JP;
Muneki Araragi, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A method for measuring a fluorescent light amount, whereby a specimen is irradiated with excitation light, and fluorescent light generated from the specimen is measured by a light-receiving element via of a receiving optical system, the method includes the steps of irradiating the specimen with excitation light having a light-amount value per specified unit area traceable to the national standard, and designated on the surface of the specimen beforehand, causing the light-receiving element to measure the fluorescent light generated from the specimen, and computing a fluorescent light-amount as measured by the light-receiving element of the receiving optical system on the basis of an excitation light-amount per the specified unit area, optical coefficients of the receiving optical system, and the acceptance coefficient of the light-receiving element, thereby working out a light amount value per the unit area traceable to the national standard.