The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Apr. 04, 2011
Applicants:

Hideaki Kanaoka, Itami, JP;

Minoru Itoh, Itami, JP;

Yoshio Okada, Itami, JP;

Chie Suzuki, Itami, JP;

Anongsack Paseuth, Itami, JP;

Inventors:

Hideaki Kanaoka, Itami, JP;

Minoru Itoh, Itami, JP;

Yoshio Okada, Itami, JP;

Chie Suzuki, Itami, JP;

Anongsack Paseuth, Itami, JP;

Assignee:

Sumitomo Electric Hardmetal Corp., Itami-Shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A surface-coated cutting tool having excellent abrasion resistance and defect resistance is provided. The surface-coated cutting tool includes a substrate and a covering layer, wherein the covering layer includes one or two or more sublayers, a thickness Tof a portion of the covering layer having the smallest thickness in a cutting edge line portion and a thickness Tof the covering layer at a point 1 mm away from a cutting edge line in a rake face direction in a cross section cut by a particular plane satisfy T<T, and a point a on the surface of the covering layer a distance Daway from the cutting edge line in the rake face direction and a point b on the surface of the covering layer a distance Daway from the cutting edge line in a flank face direction satisfy particularly numerical ranges of Dand D, and in 10% or more of a region E of the covering layer having a thickness in the range of 0.1 Tto 0.9 Tfrom the surface and extending from the point a to the point b, the deviation in the crystal orientation of crystal grains constituting the covering layer is 5 degrees or more and less than 10 degrees.


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