The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Nov. 17, 2009
Applicant:
Ricardo Avila, Clifton Park, NY (US);
Inventor:
Ricardo Avila, Clifton Park, NY (US);
Assignee:
Kitware, Inc., Clifton Park, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/08 (2006.01); G01N 23/04 (2006.01); H05G 1/60 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention relates to a method, system, and devices relating to quantitatively measuring regional lung tissue damage by combining the CT scan measurements of the mineral density deviations and/or mineral composition deviations in airway tissue, with the measurements of airflow lung function measurements.
Avila, Ricardo. (2013). Method and system for measuring lung tissue damage and disease risk (U.S. Patent No. 8465437). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8465437
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile