The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Apr. 20, 2007
Christopher M. W. Daft, Pleasanton, CA (US);
D-l Donald Liu, Issaquah, WA (US);
Paul A. Wagner, San Carlos, CA (US);
Igal Ladabaum, San Carlos, CA (US);
Christopher M. W. Daft, Pleasanton, CA (US);
D-L Donald Liu, Issaquah, WA (US);
Paul A. Wagner, San Carlos, CA (US);
Igal Ladabaum, San Carlos, CA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
To generate information representing a volume, co-arrays or synthetic transmit aperture process is performed in one dimension and beamforming is performed in another dimension. For example, a transmit aperture focuses in azimuth, but is unfocused or divergent in elevation. A multi-dimensional array receives reflected echoes. The echoes are beamformed for sub-arrays for focus in azimuth. The resulting partial beamformed information is provided to an imaging system from the probe housing for completion of beamforming at least in elevation.