The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8465415 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 18, 2013

Filed:

Mar. 18, 2010
Applicant:

Kiyotomi Ogawa, Tokyo, JP;

Inventor:

Kiyotomi Ogawa, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endoscope apparatus according to an aspect of the invention comprises an imaging unit, a detection unit, a process unit, and a measurement unit. The imaging unit comprises an imaging device and generates a first image having two fields by imaging a subject by performing interlaced driving for the imaging device. The detection unit detects the amount of shake of the first image. The process unit generates a second image from the first image based on the amount of shake. The measurement unit measures the subject based on the second image.


Find Patent Forward Citations

Ogawa, Kiyotomi. (2013). Endoscope apparatus and measurement method (U.S. Patent No. 8465415). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8465415

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