The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Jun. 04, 2010
Applicant:

Jiangang Sun, Westmont, IL (US);

Inventor:

Jiangang Sun, Westmont, IL (US);

Assignee:

UChicago Argonne, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method, apparatus, and computer program product implement enhanced thermal tomography three-dimensional (3D) thermal effusivity imaging. Experimental thermal imaging data is acquired. A response function is derived and a convolution formulation is constructed from the experimental thermal imaging data. A deconvolution solution procedure is implemented that includes constructing a matrix solution equation with a damping parameter, and solving the matrix solution equation with a selected number of iterations to construct a plurality of effusivity images. Using the novel depth deconvolution algorithm with experimental data acquired from a one-sided pulsed thermal-imaging system provides greater sensitivity for internal sample features substantially eliminating degradation in depth resolution.


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