The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8464103 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 11, 2013

Filed:

Oct. 24, 2010
Applicants:

Yoram Simha Adler, Haifa, IL;

Noam Behar, Haifa, IL;

Dale E. Blue, New York, NY (US);

Orna X Orna Raz-pelleg, Haifa, IL;

Inventors:

Yoram Simha Adler, Haifa, IL;

Noam Behar, Haifa, IL;

Dale E. Blue, New York, NY (US);

Orna X Orna Raz-Pelleg, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A functional coverage model may be generated based on a trace. The functional coverage model may comprise values of attributes. The values may be extracted from one or more entries comprised by the trace. Based upon a selection of a field of an exemplary entry, content of the corresponding fields in other entries may be extracted and utilized. In some exemplary embodiments, names of attributes may be extracted from the trace. In some exemplary embodiments, a reference trace may be utilized as a comparative baseline coverage by generating a functional coverage model based upon the reference trace and comparing coverage of a second trace in respect to the functional coverage model with the coverage of the reference trace.


Find Patent Forward Citations

Adler, Yoram. (2013). Generating a functional coverage model from a trace (U.S. Patent No. 8464103). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8464103

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