The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Oct. 29, 2009
Applicants:

Joe Scarpelli, Mountain View, CA (US);

Sridhar Sodem, Cupertino, CA (US);

Ronald Alexander Lefaive, Sunnyvale, CA (US);

Inventors:

Joe Scarpelli, Mountain View, CA (US);

Sridhar Sodem, Cupertino, CA (US);

Ronald Alexander LeFaive, Sunnyvale, CA (US);

Assignee:

BMC Software, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments disclosed herein can significantly optimize a root cause analysis and substantially reduce the overall time needed to isolate the root cause or causes of service degradation in an IT environment. By building on the ability of an abnormality detection algorithm to correlate an alarm with one or more events, embodiments disclosed herein can apply data correlation to data points collected within a specified time window by data metrics involved in the generation of the alarm and the event(s). The level of correlation between the primary metric and the probable cause metrics may be adjusted using the ratio between theoretical data points and actual points. The final Root Cause Analysis score may be modified depending upon the adjusted correlation value and presented for user review through a user interface.


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