The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Nov. 10, 2009
Applicants:

Jonathan Helfman, Half Moon Bay, CA (US);

Joseph H. Goldberg, San Carlos, CA (US);

Inventors:

Jonathan Helfman, Half Moon Bay, CA (US);

Joseph H. Goldberg, San Carlos, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 7/04 (2006.01); G06F 19/22 (2006.01);
U.S. Cl.
CPC ...
G06F 19/22 (2013.01);
Abstract

Embodiments of the invention provide systems and methods for analyzing sequential data. The sequential data can comprise a sequence of data points arranged in a particular order and thus representing a sequence. A number of such sequences can be analyzed, for example, to identify patterns or commonalities within the sequences or portions of sequences represented by the data. According to one embodiment, a method of identifying patterns in sequences of data points can comprise reading a set of sequential data. The sequential data can comprises a plurality of sequences and each of the plurality of sequences can represent an ordered sequence of tokens. A dotplot representing matches between each sequence of the plurality sequences can be generated. One or more patterns within the sequential data can then be identified based on the dotplot.


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