The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Sep. 28, 2010
Applicants:

Hitoshi Matsumura, Tokyo, JP;

Masazumi Ohishi, Tokyo, JP;

Masataka Uchida, Tokyo, JP;

Katsuaki Kobayashi, Tokyo, JP;

Tetsuro Shigemizu, Tokyo, JP;

Hidehiko Tajima, Tokyo, JP;

Inventors:

Hitoshi Matsumura, Tokyo, JP;

Masazumi Ohishi, Tokyo, JP;

Masataka Uchida, Tokyo, JP;

Katsuaki Kobayashi, Tokyo, JP;

Tetsuro Shigemizu, Tokyo, JP;

Hidehiko Tajima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality prediction system for secondary batteries according to the present invention includes: a parameter value detection portion that detects parameter values each corresponding to each of a plurality of secondary batteries to determine whether all the parameter values are normal or not; and a singular state determination portion that determines, if a difference between a reference value calculated by use of all the parameter values determined to be normal by the parameter value detection portion and at least one of the parameter values is not less than a threshold value, the secondary battery corresponding to the parameter value with the difference not less than the threshold value to be in a state different from those of the other secondary batteries out of the plurality of secondary batteries.


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