The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Jul. 31, 2007
Applicants:

Imran Bashir, Plano, TX (US);

Robert B. Staszewski, Garland, TX (US);

Oren E. Eliezer, Plano, TX (US);

Inventors:

Imran Bashir, Plano, TX (US);

Robert B. Staszewski, Garland, TX (US);

Oren E. Eliezer, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/14 (2009.01);
U.S. Cl.
CPC ...
Abstract

A novel and useful apparatus for and method of predistortion calibration and built-in self testing (BIST) of a nonlinear digitally-controlled radio frequency (RF) power amplifier (DPA) using subharmonic mixing. The RF power amplifier output is temporarily coupled into the frequency reference (FREF) input and the phase error samples generated in the phase locked loop (PLL) are then observed and analyzed. The digital predistortion and BIST mechanisms process the phase error samples to calibrate and test the DPA in the transmitter of the Digital RF Processor (DRP). The invention enables the characterization of nonlinearities, the configuration of internal predistortion, as well as the testing of the transmitter's analogRF circuitry, thereby eliminating commonly employed RF performance testing using high-cost test equipment and associated extended test times.


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