The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Aug. 13, 2012
Santosh Kumar Sadananda, San Jose, CA (US);
Christopher M. Look, Pleasanton, CA (US);
Jeffery J. Maki, Fremont, CA (US);
Santosh Kumar Sadananda, San Jose, CA (US);
Christopher M. Look, Pleasanton, CA (US);
Jeffery J. Maki, Fremont, CA (US);
Dynamic Method Enterprise Limited, Hong Kong, HK;
Abstract
A method and apparatus for performing a path based quality check for a specified bit rate in a wavelength division multiplexing optical network is described. According to one embodiment of the invention, a method selects from a database one of the available paths as a currently selected path. The database stores a representation of the available paths from an access node of the optical network to other access nodes of the optical network. The method further determines a cumulative noise, cumulative chromatic dispersion, and a maximum allowable chromatic dispersion for the currently selected path. In addition, the method determines whether the currently selected path passes the path based quality check based on whether the cumulative noise is less than the maximum allowable noise at a specific bit rate and whether the chromatic dispersion is less than the maximum allowable chromatic dispersion at the specified bit rate.