The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Dec. 15, 2009
Applicants:
H. Sprague Ackley, Seattle, WA (US);
Christophe Lopez, Munich, DE;
Inventors:
H. Sprague Ackley, Seattle, WA (US);
Christophe Lopez, Munich, DE;
Assignee:
Intermec IP Corp., Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/20 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method are described for determining the dimensions of items using an optical device, such as a barcode and/or RFID tag reader, for example. The dimensions of the field of view of the optical device are established, indexed by distance, and the dimensions of items in the field of view of the optical device are determined as a percentage of the full field of view of the optical device at the appropriate distance.
Quick Actions:
Ackley, H.. (2013). Method and apparatus for geometrical measurement using an optical device such as a barcode and/or rfid scanner (U.S. Patent No. 8463079). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8463079
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