The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Aug. 22, 2008
Mark Goodnough, Santa Ynez, CA (US);
Gene D. Tener, Oviedo, FL (US);
Mark Goodnough, Santa Ynez, CA (US);
Gene D. Tener, Oviedo, FL (US);
Lockheed Martin Corporation, Orlando, FL (US);
Abstract
An apparatus and method for acquiring image data from a scanned, multi-bank time-delay and integrate (TDI) focal plane array (FPA) detector. Specifically a method and apparatus for warping and combining sequentially-acquired image data of a scene portion from multiple TDI detector banks into a single image having improved image quality, thereby providing improved FPA sensitivity. Also, a method and apparatus for enabling sensitivity and areal rate trade-offs in a multi-bank, scanning TDI FPA based on the number of TDI banks being used for sequential imaging of the same scene portion.