The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Feb. 03, 2011
Albert Gilg, Kaufering, DE;
Utz Wever, München, DE;
Yayun Zhou, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and apparatus for difference measurement of an image, the image is detected by an image sensor array having (N×N) sensor elements, wherein N=2, n≧2, and n being an integer number, each detected sample value is read as a positive or as a negative sample value according to a sign control pattern from a pattern control unit, and measurement values are generated for measurement template blocks of the image sensor array by a computing unit which computes for each measurement template block a weighted sum of the read sample values of the respective measurement template sensor elements depending on a predetermined measurement template. A measurement template block is, provided for at least four adjacent sensor elements of the image sensor array. The method/apparatus can be used in any kind of digital camera and allows for a fast generation of image data with a hardware implementation of low complexity.