The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Dec. 09, 2009
Applicants:

Ben Yip, Homebush West, AU;

Paul Joseph Ellis, Gladesville, AU;

Son Thai, Beverly Hills, AU;

Inventors:

Ben Yip, Homebush West, AU;

Paul Joseph Ellis, Gladesville, AU;

Son Thai, Beverly Hills, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are methods () and apparatuses () for determining a location of a graphical object () printed onto a print medium (), said graphical object comprising a plurality of object marks, the method comprising the steps of superposing a two-dimensional reference pattern () having a pre-defined degree of accuracy over the printed graphical object, the two-dimensional reference pattern comprising a plurality of pattern marks (); scanning the superposed printed graphical object and reference pattern to produce a scanned image (); determining a location coordinate () of the graphical object in the scanned image (); and refining the location coordinate dependent upon the scanned reference pattern to determine a reference pattern coordinate (') associated with the location coordinate (). Also disclosed are methods (), apparatuses, and computer program products for determining a head size () of a print head () of a printer () using the aforementioned method.


Find Patent Forward Citations

Loading…