The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Feb. 16, 2012
Applicants:

En-feng Hsu, Hsin-Chu, TW;

Chi-chieh Liao, Hsin-Chu, TW;

Chung-yuo Wu, Hsin-Chu, TW;

Inventors:

En-Feng Hsu, Hsin-Chu, TW;

Chi-Chieh Liao, Hsin-Chu, TW;

Chung-Yuo Wu, Hsin-Chu, TW;

Assignee:

PixArt Imaging Inc., Science-Based Industrial Park, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Distance-measuring system with correction function includes calibrating object, transflective plate, and distance-measuring device. Distance-measuring device has a first known distance and a second known distance respectively between calibrating object and transflective plate. Transflective plate is disposed between calibrating object and distance-measuring device. Distance-measuring device includes light emitting device for emitting a detecting light with lighting-error angle, image sensor with sensing-error angle, and parameter calculating circuit. First part of detecting light passes transflective plate and is reflected by calibrating object and becomes first reflecting light emitting to first imaging location of image sensor while second part of detecting light is reflected by transflective plate and becomes second reflecting light emitting to second imaging location of image sensor. Parameter-calculating circuit calculates lighting-error angle and sensing-error angle according to first and second known distances, and first and second imaging locations.


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