The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Oct. 08, 2008
François Mirallès, Montréal, CA;
Régis Houde, Sainte-Julie, CA;
Julien Beaudry, Châteauguay, CA;
Bruce Hazel, Montréal, CA;
Jean Cöté, Sainte-Julie-de-Verchères, CA;
Michel Blain, Saint-Amable, CA;
Serge Sarraillon, Varennes, CA;
François Mirallès, Montréal, CA;
Régis Houde, Sainte-Julie, CA;
Julien Beaudry, Châteauguay, CA;
Bruce Hazel, Montréal, CA;
Jean Cöté, Sainte-Julie-de-Verchères, CA;
Michel Blain, Saint-Amable, CA;
Serge Sarraillon, Varennes, CA;
Hydro-Quebec, Montreal, Quebec, CA;
Abstract
System and method for tridimensional cartography of a structural surface. Two wires are extended in front and along the structural surface so as to define a reference surface. A measuring unit comprising a laser arrangement and a camera is moved in front of the structural surface so as to progressively scan the surface. Tow distinct light planes directed toward the structural surface are projected by means of the laser arrangement. Images of the structural surface containing lines resulting from an intersection of the light planes with the structural surface and four reference points resulting from an intersection of the light planes with the wires are captured by means of the camera. The images are processed to determine theD coordinates of the lines defining the mapping in a reference system bound to the reference surface considering the position and the orientation of the measuring unit based on the reference points.