The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
May. 24, 2010
Hidekazu Shimomura, Yokohama, JP;
Hidekazu Shimomura, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Light sources emit light beams onto deflecting surfaces of a deflecting unit through incident optical systems. The deflecting unit deflects the light beams in a uniform direction to form images onto different surfaces to be scanned through imaging optical systems. An optical path length, or a distance from a deflection point of the deflecting unit to a surface to be scanned, of an imaging optical system to form an image onto a surface to be scanned closest to the deflecting unit is different from that of an imaging optical system to form an image onto a surface to be scanned farthest from the deflecting unit. Also, the following condition is satisfied:0.85<<0.98where Kis a Kθ coefficient of an imaging optical system with a short optical path length, and Kis that of an imaging optical system with a long optical path length.