The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Mar. 26, 2010
Stephen LA Lumondiere, Torrance, CA (US);
Terence Yeoh, Pasadena, CA (US);
Martin Siu Wo Leung, Redondo Beach, CA (US);
Neil A. Ives, Hawthrone, CA (US);
Stephen La Lumondiere, Torrance, CA (US);
Terence Yeoh, Pasadena, CA (US);
Martin Siu Wo Leung, Redondo Beach, CA (US);
Neil A. Ives, Hawthrone, CA (US);
The Aerospace Corporation, El Segundo, CA (US);
Abstract
An illumination source may be directed towards a surface of an object comprising subsurface features, wherein the illumination from the source is directed at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface, the portion having an index of refraction that is greater than the index of refraction of a surrounding medium that surrounds the object. An imaging device may be placed with an objective lens. The first angle may be larger than an acceptance angle of the objective lens. In some embodiments, multiple illumination beams may be generated by one or more illumination sources. The beams may be rotated relative to one another about the normal of the surface. Also, in some embodiments, multiple images may be taken with the objective of the imaging device at different positions rotated off of the normal. The multiple images may be combined to generate a composite image.