The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Feb. 16, 2010
Hiroshi Kurono, Kobe, JP;
Keitarou Kondou, Kobe, JP;
Hiroshi Kurono, Kobe, JP;
Keitarou Kondou, Kobe, JP;
Sysmex Corporation, Hyogo, JP;
Abstract
A sample analyzer is provided. The sample analyzer includes a reagent container holder, a measurement unit, and an information processing unit configured to perform operations including controlling the measurement unit to start the successive measurement of the plurality of samples, determining whether to switch from the first reagent container to the second reagent container while performing the successive measurement by using the reagent contained in the first reagent container, controlling the measurement unit to suspend a start of aspiration of a next sample, to measure a quality control measurement sample prepared from the reagent contained in the second reagent container, when determined to switch from the first reagent container to the second reagent container, and controlling the measurement unit to start the aspiration of the next sample when an analysis result of the quality control measurement sample meets a predetermined condition.