The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Apr. 19, 2006
Applicants:
Toshinori Fujiwara, Kyoto, JP;
Hideki Tanji, Kyoto, JP;
Naoyuki Usagawa, Kyoto, JP;
Inventors:
Assignee:
Arkray, Inc., Kyoto-Shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to an analyzer () including a photometry mechanism () for photometrically analyzing a reagent pad of an analytical tool to which a sample is applied, and a table () including a placing portion () at which the analytical tool is to be placed. The light emitting surface () or the light incident surface () of the light from the light emitting elements () of the photometry mechanism () is cleaned, with a cleaning tool () placed at the table (). The present invention further provides a cleaning tool () for cleaning the photometry mechanism () of the analyzer ().