The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

Nov. 09, 2009
Applicants:

Hiromu Watanabe, Yokohama, JP;

Masumi Itou, Yokohama, JP;

Keiichi Seki, Yokohama, JP;

Hiroshi Wada, Yokohama, JP;

Motoyuki Shigeiwa, Yokohama, JP;

Kaoru Terada, Yokohama, JP;

Naoto Kijima, Yokohama, JP;

Inventors:

Hiromu Watanabe, Yokohama, JP;

Masumi Itou, Yokohama, JP;

Keiichi Seki, Yokohama, JP;

Hiroshi Wada, Yokohama, JP;

Motoyuki Shigeiwa, Yokohama, JP;

Kaoru Terada, Yokohama, JP;

Naoto Kijima, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 11/59 (2006.01); C09K 11/62 (2006.01); C09K 11/64 (2006.01); C09K 11/66 (2006.01); C09K 11/67 (2006.01); C09K 11/77 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a phosphor comprising a nitride or an oxynitride, comprising an X-ray powder diffraction pattern comprising at least one Region having at least one peak with an intensity ratio I of 8% or less, the X-ray powder diffraction pattern measured in the 2θ range from 10° to 60° using a CuKα line (1.54184 {acute over (Å)}), wherein the Region is the 2θ range from 41.5° to 47°, the intensity of each peak is a value obtained after background correction, and the intensity ratio I is defined by the formula (I×100)/I(%), where Irepresents the height of the most intense peak present in the 2θ range from 34° to 37° and Irepresents the height of each peak.


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