The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2013

Filed:

May. 17, 2012
Applicants:

Xiaolong Ouyang, Palo Alto, CA (US);

Paul D. Indman, San Jose, CA (US);

Robert K. Deckman, San Bruno, CA (US);

Shih-ping Wang, Los Altos, CA (US);

Inventors:

Xiaolong Ouyang, Palo Alto, CA (US);

Paul D. Indman, San Jose, CA (US);

Robert K. Deckman, San Bruno, CA (US);

Shih-Ping Wang, Los Altos, CA (US);

Assignee:

EndoSee Corporaton, Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/12 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and devices are described for performing a combined hysteroscopy and endometrial sampling. Techniques for improving visual images include forward facing fluid ports for clearing tissue debris and LED positioning and design. Manufacturability is improved through separately formed tip and shaft pieces. User interface features are described including user-friendly handle-mounted buttons as well the use of an interactive integrated touch screen display. The handle and display can be mated to a docking station for storage and recharging batteries.


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