The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Mar. 16, 2011
Markus Seesselberg, Aalen, DE;
Peter Reimer, Ellwangen, DE;
Christoph Hauger, Aalen, DE;
Christoph Kuebler, Oberkochen, DE;
Markus Seesselberg, Aalen, DE;
Peter Reimer, Ellwangen, DE;
Christoph Hauger, Aalen, DE;
Christoph Kuebler, Oberkochen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention relates to an optical measuring system comprising a wave front sensor for characterizing a shape of a wave front of measuring light and an imaging lens, wherein the imaging lens comprises a first optical assembly and a second optical assembly for imaging an object region in an entrance region of the wave front sensor. A distance between the object region and the first optical assembly is larger than a focal length of the first optical assembly. Furthermore, the optical measuring system can comprise an optical microscopy system and optionally an OCT system for carrying out different optical examination methods at the same time.