The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Dec. 03, 2012
Direct Measurements, Inc., Atlanta, GA (US);
Gregory Hovis, Martinez, GA (US);
William Ranson, Columbia, SC (US);
Reginald Vachon, Atlanta, GA (US);
Direct Measurements, Inc., Atlanta, GA (US);
Abstract
A non-linear strain gage includes a target for association with an object for which at least one of strain and fatigue damage is to be measured, a sensor, and a computer. The target incorporates a nested binary code symbol for perimeter-based deformation and strain analysis and emits a detectable physical quantity. The binary code symbol includes a boundary binary code symbol having a perimeter constructed of line segments and at least a core code symbol that provides encoded data. The core code symbol is nested within and concentric with the boundary binary code symbol. A method of measuring strain on an object directly using the non-linear strain gage is also provided.