The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2013
Filed:
Apr. 21, 2011
Fang-yuan Chen, Shenzhen, CN;
Shu-qi Wu, Shenzhen, CN;
Yang Chen, Shenzhen, CN;
Yu-lin Liu, Shenzhen, CN;
Fang-Yuan Chen, Shenzhen, CN;
Shu-Qi Wu, Shenzhen, CN;
Yang Chen, Shenzhen, CN;
Yu-Lin Liu, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A testing apparatus includes a support mechanism, a pushing device and a clamping device. The pushing device includes a guiding member, a driving member moveably attached to the guiding member, and a resilient component located between the guiding member and the guiding member. The clamping device is attached to the driving member, and secures a product. The driving member and the clamping device deforms the resilient component in a first direction, and the resilient component biases the driving member and the clamping device in a second direction, that is opposite to the first direction.