The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8458811 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 04, 2013

Filed:

Mar. 25, 2011
Applicants:

Erik J. Luber, Edmonton, CA;

Colin Ophus, Berkeley, CA (US);

David Mitlin, Sherwood Park, CA;

Brian Olsen, Edmonton, CA;

Christopher Harrower, Edmonton, CA;

Velimir Radmilović, Piedmont, CA (US);

Inventors:

Erik J. Luber, Edmonton, CA;

Colin Ophus, Berkeley, CA (US);

David Mitlin, Sherwood Park, CA;

Brian Olsen, Edmonton, CA;

Christopher Harrower, Edmonton, CA;

Velimir Radmilović, Piedmont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
Abstract

An all-metal microdevice or nanodevice such as an atomic force microscope probe is manufactured from a copper-hafnium alloy thin film having an x-ray amorphous microstructure.


Find Patent Forward Citations

Luber, Erik. (2013). Micro/nano devices fabricated from cu-hf thin films (U.S. Patent No. 8458811). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8458811

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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