The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Oct. 30, 2007
Applicants:

Sung Chung Park, Daejeon, KR;

Jun Jin Kong, Yongin-si, KR;

Seung Jae Lee, Hwaseong-si, KR;

Seung-hwan Song, Incheon, KR;

Inventors:

Sung Chung Park, Daejeon, KR;

Jun Jin Kong, Yongin-si, KR;

Seung Jae Lee, Hwaseong-si, KR;

Seung-Hwan Song, Incheon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to an example embodiment, a method of generating a soft decision value using an Analog-to-Digital Converter (ADC) having a given resolution may include receiving metric values calculated based on levels of a transmission signal and output levels of the ADC. Metric values corresponding to a level of a received signal may be selected from among the received metric values. A first maximum metric value may be detected from among the selected metric values when a transmission bit is a first level, and a second maximum metric value may be detected from among the selected metric values when the transmission bit is a second level. The soft decision value may be generated based on a difference between the first maximum metric value and the second maximum metric value.


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