The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Mar. 29, 2010
Applicants:
Lawrence J. Dalphy, Mission Viejo, CA (US);
Curtis E. Stevens, Irvine, CA (US);
Daniel K. Blackburn, Irvine, CA (US);
Inventors:
Lawrence J. Dalphy, Mission Viejo, CA (US);
Curtis E. Stevens, Irvine, CA (US);
Daniel K. Blackburn, Irvine, CA (US);
Assignee:
Western Digital Technologies, Inc., Irvine, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
Abstract
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.