The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Mar. 31, 2010
Applicants:

Benoit Feix, Aubagne, FR;

Georges Gagnerot, Marseilles, FR;

Mylene Roussellet, Les Milles, FR;

Vincent Verneuil, Aix en Provence, FR;

Inventors:

Benoit Feix, Aubagne, FR;

Georges Gagnerot, Marseilles, FR;

Mylene Roussellet, Les Milles, FR;

Vincent Verneuil, Aix en Provence, FR;

Assignee:

Inside Secure, Aix-en-Provence Cedex, FR;

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process for testing an integrated circuit includes collecting a set of points of a physical property while the integrated circuit is executing a multiplication, dividing the set of points into a plurality subsets of lateral points, calculating an estimation of the value of the physical property for each subset, and applying to the subset of lateral points a step of horizontal transversal statistical processing by using the estimations of the value of the physical property, to verify a hypothesis about the variables manipulated by the integrated circuit.


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