The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8457732 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 04, 2013

Filed:

May. 09, 2008
Applicant:

Kosei Fukada, Tokyo, JP;

Inventor:

Kosei Fukada, Tokyo, JP;

Assignee:

Tanita Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a biometric apparatus having a display which allows a measured person to recognize biometric data easily and reliably irrespective of whether the measured person is on a platform or not. The biometric apparatus for measuring biometric data of the measured person includes the platform on which the measured person gets on, a sensor unit for acquiring the biometric data of the measured person; a display for displaying the biometric data acquired by the sensor unit; and a control unit for determining whether the measured person is on the platform or not on the basis of a signal from the sensor unit and changes the display mode to display the biometric data on the display according to the determination thereof.


Find Patent Forward Citations

Fukada, Kosei. (2013). Biometric apparatus (U.S. Patent No. 8457732). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8457732

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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