The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Feb. 14, 2008
Tal Nir, Haifa, IL;
Alfred M. Bruckstein, Haifa, IL;
Ron Kimmel, Haifa, IL;
Abstract
An optical flow estimation process based on a spatio-temporal model with varying coefficients multiplying a set of basis functions at each pixel. The benefit of over-parameterization becomes evident in the smoothness term, which instead of directly penalizing for changes in the optic flow, accumulates a cost of deviating from the assumed optic flow model. The optical flow field is represented by a general space-time model comprising a selected set of basis functions. The optical flow parameters are computed at each pixel in terms of coefficients of the basis functions. The model is thus highly over-parameterized, and regularization is applied at the level of the coefficients, rather than the model itself. As a result, the actual optical flow in the group of images is represented more accurately than in methods that are known in the art.