The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Oct. 16, 2012
Danmarks Tekniske Universitet, Lyngby, DK;
Erik Mejdal Lauridsen, Harlev, DK;
Henning Friis Poulsen, Roskilde, DK;
Danmarks Tekniske Universitet, Lyngby, DK;
Abstract
An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (), a staging device () rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector () detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector () positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device () for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.