The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Oct. 17, 2011
Anatoli Arodzero, Billerica, MA (US);
Martin Rommel, Lexington, MA (US);
Aleksandr Saverskiy, North Andover, MA (US);
Rajen Sud, Burlington, MA (US);
Anatoli Arodzero, Billerica, MA (US);
Martin Rommel, Lexington, MA (US);
Aleksandr Saverskiy, North Andover, MA (US);
Rajen Sud, Burlington, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
Methods and systems for x-ray inspection of an object using pulses whose spectral composition varies during the course of each pulse. A temporal sequence of pulses of penetrating radiation is generated such that the spectral content of each pulse evolves with time. The pulses are formed into a beam that is scanned across the object and detected after traversing the object. The detector signal is processed to derive at least one material characteristic of the object, such as effective atomic number, on the basis of temporal evolution of the detector signal during the course each pulse of the sequence of pulses. The time intervals may be predetermined, or else adapted based on features of the detected signal.