The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Sep. 28, 2010
Harri Salo, Vantaa, FI;
Harri Salo, Vantaa, FI;
Janesko Oy, Vantaa, FI;
Abstract
A measurement window structure is disclosed for an optical process measurement device. The measurement window structure can include a measurement window made of an optical material and having a measurement surface that is arranged to be placed into a process solution, a sealing surface formed to a frame structure of the optical process measurement device and facing the process solution, the measurement window made of an optical material being arranged to press against the sealing surface, and an attaching device or mechanism for pressing the measurement window made of an optical material against the sealing surface and for attaching it to the frame structure. The sealing surface formed to the frame structure can be a rotationally symmetrical surface and the surface pressing against the sealing surface formed to the frame structure of the measurement window made of an optical material can be a rotationally symmetrical surface.