The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Feb. 22, 2011
Allen Olson, San Diego, CA (US);
Greg Crandall, Rancho Santa Fe, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Allen Olson, San Diego, CA (US);
Greg Crandall, Rancho Santa Fe, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
Aperio Technologies, Inc., Vista, CA (US);
Abstract
Methods and apparatus are provided for computing focus information prior to scanning digital microscope slide data with a line scan camera. The methods include a point-focus procedure that works by moving the slide to the desired measurement location, moving the objective lens through a predefined set of height values, acquiring imagery data at each height, and determining the height of maximum contrast. The methods also include a ribbon-focus procedure whereby imagery data are acquired continuously, while the slide and objective lens are in motion. Both methods may be applied with either a static or a dynamic implementation.